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Georgia Tech Electronics and Micro-System Lab (GEMS)
GEMS

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We are located at the Technology Square that is the premier center at Georgia Tech for next-generation high-performance microelectronics and bioelectronics research.

 

 

We have full in-house hybrid electronics assembly capabilities at GEMS lab, including wirebonding, microfluidic fabrication, CMOS-microfluidics packaging, chip-on-board packaging, chip-on-package packaging, and RF/mm-wave flip-chip packaging.

We also have access to all the world-class fabrication, packaging, and micromachining facilities at Georgia Tech. The Pettit Microelectronics Research houses an 8,500-square-foot cleanroom (75% class 100, 25% class 10). The Marcus Nanotechnology Building includes an additional 10,000 square feet of semiconductor cleanroom space for nanoelectronic device fabrication and 5,000 square feet of biological cleanroom space.

In the above picture, Taiyun is examining a PCB test module with a CMOS multi-modality cellular sensor array chip. This work was presented at IEEE ISSCC 2015.

 

 

We have full RF/Mm-Wave/Sub-Mm-Wave in-house testing capabilities at GEMS lab, including network analyzers, spectrum analyzers, RF analog signal generators, vector signal generator, and oscilloscopes.

In the above picture, Dr. Wang and Song Hu are at one of our RFIC testing setups for power amplifier characterization. This RF power amplifier work was presented at IEEE ISSCC 2015.

 

 

Our RF/Mm-Wave/Sub-Mm-Wave measurement capabilties cover up to 325GHz (with network analyzer capability) and up to 500GHz (with power and spectrum measurement capability).

Our 110-170GHz network analyzer system from Keysight is shown in the above picture.

 

 

Our 220-325GHz network analyzing system from Rhode & Schwarz. This equipment is sponsored by the 2014 Defense University Research Instrumentation Program (DURIP).

 

 

A close-in view of one of our RF/mm-wave IC testing setups with on-chip probing.

 

 

Our time-domain/mixed-signal mesurement capabilities at GEMS lab include pulse pattern generator, logic analyzer, arbitrary waveform generator, oscilloscopes, and a full Bit Error Rate Testing (BERT) system.

Stefan and Manoj are checking their mixed-signal measurement setup in the above picture.

 

 

We also have access to other state-of-the-art analog/RF/mm-wave measurement capabilities through collaborations with the Georgia Electronics Design Center (GEDC) and other Georgia Tech research groups.

The above figures show a cascade semi-automatic probe station with a 110GHz network analyzing system (left), a high-power 18GHz RF load/source pull system (middle), and an antenna testing anechoic chamber (right).

 

Group event at Red Top Mountain State Park in October 2016

 

Group event at Red Top Mountain State Park in October 2016

 

Group dinner (Korean BBQ) in Nov 2015!

 

We are celebrating the new year! From left to right: Song, Jong Seok and Min-Yu

 

 

Group hiking event at Cloudland Canyon State Park in October 2014

 

 

Group hiking event at Cloudland Canyon State Park in October 2014

 

 

Jong Seok is explaining IC testing to local high school students in one of our outreach events.

 

 

Group dinner (Korean BBQ) in November 2012

 

 

 

Last revised on January 29th, 2015.