We are located at the Marcus Nanotechnology Building that is the premier center at Georgia Tech for next-generation high-performance microelectronics and bioelectronics research.
We have full in-house hybrid electronics assembly capabilities at
GEMS lab, including wirebonding, microfluidic
fabrication, CMOS-microfluidics packaging, chip-on-board packaging, chip-on-package packaging, and
RF/mm-wave flip-chip packaging.
We also have access to all the world-class fabrication, packaging,
and micromachining facilities at Georgia Tech. The Pettit Microelectronics
Research houses an 8,500-square-foot cleanroom (75% class 100, 25% class 10).
The Marcus Nanotechnology Building includes an additional 10,000 square feet of
semiconductor cleanroom space for nanoelectronic device fabrication and 5,000 square feet of biological cleanroom space.
In the above picture, Taiyun is
examining a PCB test module with a CMOS multi-modality cellular sensor array
chip. This work was presented at IEEE ISSCC 2015.
We have full RF/Mm-Wave/Sub-Mm-Wave in-house testing capabilities
at GEMS lab, including network analyzers, spectrum analyzers, RF analog signal
generators, vector signal generator, and oscilloscopes.
In the above picture, Dr. Wang and Song Hu are at one of our RFIC
testing setups for power amplifier characterization. This RF power amplifier
work was presented at IEEE ISSCC 2015.
Our RF/Mm-Wave/Sub-Mm-Wave measurement capabilties cover up to 325GHz (with network analyzer capability) and up to 500GHz (with
power and spectrum measurement capability).
Our 110-170GHz network analyzer system from Keysight is shown in the above picture.
Our 220-325GHz network analyzing system from Rhode &
Schwarz. This equipment is sponsored by the 2014 Defense University Research
Instrumentation Program (DURIP).
A close-in view of one of our RF/mm-wave IC testing setups with
on-chip probing.
Our time-domain/mixed-signal mesurement capabilities at GEMS lab include pulse pattern generator, logic analyzer, arbitrary waveform generator, oscilloscopes, and a full Bit
Error Rate Testing (BERT) system.
Stefan and Manoj are checking their
mixed-signal measurement setup in the above picture.
We also have access to other state-of-the-art analog/RF/mm-wave
measurement capabilities through collaborations with the Georgia Electronics
Design Center (GEDC) and other Georgia Tech research groups.
The above figures show a cascade semi-automatic probe station with
a 110GHz network analyzing system (left), a high-power 18GHz RF load/source
pull system (middle), and an antenna testing anechoic chamber (right).
Group event at Stone Mountain Park in July 2018
Group event at Stone Mountain Park in July 2018
Group event at Red Top Mountain State Park in October 2016
Group event at Red Top Mountain State Park in October 2016
Group dinner (Korean BBQ) in Nov 2015!
We are celebrating the new year! From
left to right: Song, Jong Seok and Min-Yu
Group hiking event at Cloudland Canyon State Park in October 2014
Group hiking event at Cloudland Canyon State Park in October 2014
Jong Seok is explaining IC testing to
local high school students in one of our outreach events.
Group dinner (Korean BBQ) in November 2012
Last revised on Feb 5th, 2021